6 results
Characterization of Small Cu Grains Using the Conical Dark-Field Technique in the Transmission Electron Microscope
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- Journal:
- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1100-1101
- Print publication:
- July 2011
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In-situ Low Energy Argon Ion Milling of Nanoelectronic Structures Using a Triple Beam System
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- Journal:
- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 170-171
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- July 2009
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Determination of dielectric permittivity from EELSpectra in semiconductor structures
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- Journal:
- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 1252-1253
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- August 2007
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Measurement of k-value in Semiconductor Structures
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- Journal:
- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1176-1177
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- August 2006
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Off-axis Electron Holography for 2D Dopant Profiling in p- and n-Metal Oxide Semiconductor Field Effect Transistors (MOSFETs)
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- Journal:
- Microscopy and Microanalysis / Volume 9 / Issue S03 / September 2003
- Published online by Cambridge University Press:
- 05 September 2003, pp. 240-241
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- September 2003
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Integration Challenges for Advanced Salicide Processes and their Impact on CMOS Device Performance
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- Journal:
- MRS Online Proceedings Library Archive / Volume 611 / 2000
- Published online by Cambridge University Press:
- 14 March 2011, C5.1.1
- Print publication:
- 2000
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